Design for Test/ Debug (DFT/DFD)

By December 3, 2020Brochure/Newsletter

Our team of Design for Testability experts can help increase IC test coverage, yields and quality.

Design for Testing (DFT) and Debugging (DFD) are critical stages in the micro-architectural phase of a design. Working in tandem with a client’s design team, our experts understand the structure of the chip which enables them to create the complete DFT and DFD architecture.

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