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Failure Analysis & Reliability Lab - Other analytical Services

Other analytical Services

  • Manual Curve Tracing
  • Automated Curve Tracing
  • Tabletop ATE System
  • Optical Microscopy: Frontside and Backside
  • Scanning Acoustic Microscopy
  • Real-Time X-Ray
  • NIR Photon Emission Microscopy (InGaAs)
  • Thermal Mapping (InSb)
  • Scanning Optical Microscopy (λ=1064 nm & 1340nm)
  • Static SOM Techniques: VBA with pulsing
  • Dynamic SOM Techniques: SDL, LADA
  • Laser Timing Probe Analysis
  • Backside Sample Preparation: Global and Selected Area
  • Selected Area Milling
  • Die Extraction
  • Layer by Layer Deprocessing: Chemical and Mechanical
  • Cross-Sectioning: Mechanical and FIB
  • Field-Emission Scanning Electron Microscopy (FE-SEM)
  • Ultra-Thin Window EDX Spectroscopy (EDS)
  • Auger Electron Spectroscopy (AES)
  • X-Ray Photoelectron Spectroscopy (XPS)
  • SIMS Dopant Profiling
  • TOF-SIMS Surface Elemental Analysis
  • X-Ray Diffraction (XRD) Analysis
  • Atomic Force Microscopy (AFM)

Failure Analysis & Reliability Lab

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