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Failure Analysis & Reliability Lab - Focused Ion Beam (FIB)

Focused Ion Beam (FIB)

  • CAD navigation through Knight software
  • GAE through specially designed Quad/Tri gas nozzles
  • Laser guided state movement
  • Circuit Edit up to 65nm technology (extended to 45nm)
  • Circuit Edits for Semiconductor application using Micrion
  • 9800FC 10nm beam resolution FIB
  • Milling and deposition of complex metal structure
  • Probe Pad construction

Failure Analysis & Reliability Lab

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