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Failure Analysis & Reliability Lab

Failure Analysis & Reliability Lab

Semiconductor Lab

The Semiconductor Lab facility at Tessolve premises provides some of the unique value added services such as Focused Ion Beam - an expensive technique used to perform Circuit Edit like metal cut / metal growth required to remove / make electrical connectivity inside the Silicon. Optical Microscopy - an expensive equipment to analyze chip layout, Bonding arrangement etc., The other services include Decapsulation of the Device Package, Failure Analysis and Characterization Lab. The Characterization Lab is a unique facility in India to perform complete Electrical Level characterization of the Silicon Devices and is aided by Government Of India. Thus Tessolve is a one stop place for Semiconductor companies to perform Testing, Debugging and Characterizing the devices using advanced technologies in a cost effective, Speedy way.

Failure Analysis & Reliability Lab

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