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Failure Analysis & Reliability Lab - Equipment

Equipment

FA Tools Equipment Brand/Model Application Image
FIB Micrion 9800FC Circuit EDIT upto 65nm process gate technology. Edit upto 8 layers can be performed. Micrion 9800FC is designed with 10nm Ion beam with integrated Chemical cabinet, Lazer interferometer for precision movement.

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Dual Acid Decapsulator Nisene 350D Capable of decapping any package using dual acid process recipe

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Tear Down Analysis TDA on Die/Package/Substrate

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Optical Microscopy Nikon LV150 High resolution optical imaging upto 1000x with built in measurement software & hotspot detection capability.

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X-Ray Dage 2D high resolution X-Ray imaging for packaging analysis

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Failure Analysis & Reliability Lab

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