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IC Design Engineering - DESIGN FOR TEST (DFT)

DESIGN FOR TEST

Design for Test (DFT) is very rapidly growing technology in VLSI Industry. We add testability features to the hardware design to test manufacturing defects. Tessolve offers DFT services in Scan Insertion, ATPG, Pre/Post silicon validation, Memory Built in Self-Test (MBIST) and JTAG for complex designs. Our engineers are well experienced with good exposure to industry standard EDA tools.


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